Bulletin of the Seismological Society of America -- Index by Author (Apr 2003; Volume 93, Number 2)

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Index by Author: Apr 2003; 93 (2) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Alcántara, L. [Abstract] [Full Text]; Ambraseys, Nicolas [Abstract] [Full Text]; Anderson, John G. [Abstract] [Full Text]; Arellano, Jose F. [Abstract] [Full Text]
B: Bielak, Jacobo [Abstract] [Full Text]; Bielak, Jacobo [Abstract] [Full Text]; Bilham, Roger [Abstract] [Full Text]; Blomberg, W. Stephen [Abstract] [Full Text]; Bonner, Jessie L. [Abstract] [Full Text]; Boore, David M. [Abstract] [Full Text]; Bour, Myriam [Abstract] [Full Text]; Bradley, C. R. [Abstract] [Full Text]; Brocher, Thomas M. [Abstract] [Full Text]
C: Castro, Raúl R. [Abstract] [Full Text]; Chan, Yu-Chang [Extract] [Full Text]; Chen, Wen-Shan [Extract] [Full Text]; Chen, Yue-Gau [Extract] [Full Text]; Chu, Hao-Tsu [Extract] [Full Text]; Cimilli, Serkan [Abstract] [Full Text]; Clayton, R. W. [Abstract] [Full Text]; Cochran, Elizabeth [Abstract] [Full Text]; Creager, Kenneth C. [Abstract] [Full Text]; Crosson, Robert S. [Abstract] [Full Text]; Crouse, C. B. [Abstract] [Full Text]
D: Day, S. M. [Abstract] [Full Text]; Day, Steven M. [Abstract] [Full Text]; Del Gaudio, V. [Abstract] [Full Text]; Dreger, D. [Abstract] [Full Text]; Durukal, Eser [Abstract] [Full Text]
E: Eakins, Jennifer [Abstract] [Full Text]; Erdik, Mustafa [Abstract] [Full Text]
F: Fabriol, Hubert [Abstract] [Full Text]; Fäh, Donat [Abstract] [Full Text]; Fernández, Antonio [Abstract] [Full Text]; Festa, G. [Abstract] [Full Text]; Fujita, Kazuya [Abstract] [Full Text]; Furumura, T. [Abstract] [Full Text]
G: Giardini, Domenico [Abstract] [Full Text]; Gounbina, Larissa V. [Abstract] [Full Text]
H: Haines, John [Abstract] [Full Text]; Hisada, Yoshiaki [Abstract] [Full Text]; Hisada, Yoshiaki [Abstract] [Full Text]; Hong, Tae-Kyung [Abstract] [Full Text]; Huang, B.-S. [Extract] [Full Text]; Hyvernaud, Olivier [Abstract] [Full Text]
I: Igel, Heiner [Abstract] [Full Text]; Iglesias, A. [Abstract] [Full Text]; Imaev, Valery S. [Abstract] [Full Text]; Imaeva, Ludmilla P. [Abstract] [Full Text]
K: Kato, Naoyuki [Abstract] [Full Text]; Kennett, B. L. N. [Abstract] [Full Text]; Kennett, B. L. N. [Abstract] [Full Text]; Kind, Fortunat [Abstract] [Full Text]; Kiratzi, A. [Abstract] [Full Text]; Kohler, M. D. [Abstract] [Full Text]; Koketsu, K. [Abstract] [Full Text]; Koz'min, Boris M. [Abstract] [Full Text]; Kuge, Keiko [Abstract] [Full Text]
L: Le Brun, Benoit [Abstract] [Full Text]; Lee, Jian-Cheng [Extract] [Full Text]; Lee, Yuan-Hsi [Abstract] [Full Text]; Legrand, D. [Abstract] [Full Text]; Li, Yong-Gang [Abstract] [Full Text]; Liu, Enru [Abstract] [Full Text]; Loukakis, Kostas [Abstract] [Full Text]; Lu, Shih-Ting [Abstract] [Full Text]
M: Mackey, Kevin G. [Abstract] [Full Text]; Magistrale, H. [Abstract] [Full Text]; McGuire, Jeffrey J. [Abstract] [Full Text]; Miller, Kate C. [Abstract] [Full Text]; Min, Dong-Joo [Abstract] [Full Text]; Mueller, Karl [Extract] [Full Text]
N: Ni, James F. [Abstract] [Full Text]; Nielsen, S. [Abstract] [Full Text]; Novikova, T. [Extract] [Full Text]
O: Oglesby, David D. [Abstract] [Full Text]; Okal, Emile A. [Abstract] [Full Text]; Olsen, K. B. [Abstract] [Full Text]; Ordaz, M. [Abstract] [Full Text]; Ortiz, M. [Abstract] [Full Text]
P: Pacheco, J. F. [Abstract] [Full Text]; Panza, Giuliano F. [Extract] [Full Text]; Pearson, D. Craig [Abstract] [Full Text]; Phillips, W. Scott [Abstract] [Full Text]; Pierri, P. [Abstract] [Full Text]; Pratt, R. Gerhard [Abstract] [Full Text]; Pratt, Thomas L. [Abstract] [Full Text]; Purvance, Matthew D. [Abstract] [Full Text]
Q: Quintanar, Luis [Abstract] [Full Text]
R: Ramirez, Juan Carlos [Abstract] [Full Text]; Rapine, Richard R. [Abstract] [Full Text]; Rebollar, Cecilio J. [Abstract] [Full Text]; Reyes, Luis M. [Abstract] [Full Text]; Reymond, Dominique [Abstract] [Full Text]; Romanelli, Fabio [Extract] [Full Text]; Roumelioti, Z. [Abstract] [Full Text]; Rubin, Charles [Extract] [Full Text]
S: Schmid, Christian [Abstract] [Full Text]; Schulte-Pelkum, Vera [Abstract] [Full Text]; Sedov, Boris M. [Abstract] [Full Text]; Shih, Tung-Sheng [Abstract] [Full Text]; Shin, Changsoo [Abstract] [Full Text]; Sieh, Kerry [Extract] [Full Text]; Singh, S. K. [Abstract] [Full Text]; Snelson, Catherine M. [Abstract] [Full Text]; Steimen, Sibylle [Abstract] [Full Text]
T: Talandier, Jacques [Abstract] [Full Text]; Taylor, Steven R. [Abstract] [Full Text]; Teng, Jiwen [Abstract] [Full Text]; Theodoulidis, N. [Abstract] [Full Text]; Tréhu, Anne M. [Abstract] [Full Text]; Tullis, Terry E. [Abstract] [Full Text]
U: Uebayashi, Hirotoshi [Abstract] [Full Text]
V: Vernon, Frank L. [Abstract] [Full Text]; Vidale, John E. [Abstract] [Full Text]
W: Wang, Guo-Quan [Abstract] [Full Text]; Wasowski, J. [Abstract] [Full Text]; Weaver, Craig S. [Abstract] [Full Text]; Wen, K.-L. [Extract] [Full Text]; Wu, Wei-Yu [Abstract] [Full Text]
Y: Yang, Dinghui [Abstract] [Full Text]; Yang, Xiaoning [Abstract] [Full Text]; Yanovskaya, Tatiana B. [Extract] [Full Text]; Yeats, Robert [Extract] [Full Text]; Yoo, Hai Soo [Abstract] [Full Text]; Yoshimura, Chiaki [Abstract] [Full Text]; Yoshimura, Chiaki [Abstract] [Full Text]; Yu, Jiashun [Abstract] [Full Text]
Z: Zhang, Zhongjie [Abstract] [Full Text]; Zhou, Xi-Yuan [Abstract] [Full Text]

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